Reliability testThe purpose of reliability test on Siliup products is to find out the weak points, to understand, verify, evaluate, analysis and improve the reliability of products. Different levels of chips will work under different application environments. The more complex the application environment, the requirements on reliability will be higher and stricter. All our products have been tested strictly before shipment to ensure that the products delivered to customers are verified. However, in order to evaluated the performance after working long times, further reliability tests are needed to simulate the impact of some harsh service conditions on the products in actual environment, so as to evaluate the service life and possible risks of the chip and improve the product performance.
Test itemsDifferent grades of products have different requirements. The purpose of reliability test is to prove that they meet the classification standards. The test items of reliability test are designed according to the specific application environment of different levels of products, simulate the environmental factors of products in normal use, and verify their functional consistency and durability.
| 要求 Requirement等級(jí) Rank | 消費(fèi)級(jí) Consumption grade | 工業(yè)級(jí) Industrial grade | 車(chē)規(guī)級(jí) Automotive grade |
|---|---|---|---|
| 應(yīng)用 | 手機(jī)、PC等 | 工業(yè)控制 | 汽車(chē)電子 |
| 溫度 | 0~70℃ | -40~85℃ | -40~150℃ |
| 濕度 | 中 | 根據(jù)環(huán)境 | 0~100% |
| 振動(dòng)/沖擊 | 中 | 較高 | 高 |
| 壽命 | 1~3年 | 5-10年 | 15年 |
| 可靠性 | 中 | 較高 | 高 |
| 出錯(cuò)率 | <3% | <1% | 0 |
Consumption grade| 試驗(yàn)類(lèi)別 Category | 試驗(yàn)項(xiàng)目 Test Contents | 試驗(yàn)條件 Condition | 試驗(yàn)時(shí)間 Time | 樣品數(shù)量 S.S | 判定標(biāo)準(zhǔn) Acc/Re | 參考標(biāo)準(zhǔn) Reference |
|---|---|---|---|---|---|---|
| 環(huán)境試驗(yàn) | HTS (高溫存儲(chǔ)) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低溫存儲(chǔ)) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (溫度循環(huán)) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (壓力蒸煮試驗(yàn)) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （無(wú)偏高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高溫高濕反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (預(yù)處理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 30℃/60%RH ，192hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Industrial grade| 試驗(yàn)類(lèi)別 Category | 試驗(yàn)項(xiàng)目 Test Contents | 試驗(yàn)條件 Condition | 試驗(yàn)時(shí)間 Time | 樣品數(shù)量 S.S | 判定標(biāo)準(zhǔn) Acc/Re | 參考標(biāo)準(zhǔn) Reference |
|---|---|---|---|---|---|---|
| 壽命試驗(yàn) | HTGB (高溫柵極偏置) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 |
| HTRB (高溫反向偏壓) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 | |
| 環(huán)境試驗(yàn) | HTS (高溫存儲(chǔ)) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低溫存儲(chǔ)) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (溫度循環(huán)) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (壓力蒸煮試驗(yàn)) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （無(wú)偏高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高溫高濕反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (預(yù)處理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 30℃/60%RH ，192hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Automotive?grade| 試驗(yàn)類(lèi)別 Category | 試驗(yàn)項(xiàng)目 Test Contents | 試驗(yàn)條件 Condition | 試驗(yàn)時(shí)間 Time | 樣品數(shù)量 S.S | 判定標(biāo)準(zhǔn) Acc/Re | 參考標(biāo)準(zhǔn) Reference |
|---|---|---|---|---|---|---|
| 壽命試驗(yàn) | HTGB (高溫柵極偏置) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 |
| HTRB (高溫反向偏壓) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 | |
| 環(huán)境試驗(yàn) | HTS (高溫存儲(chǔ)) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低溫存儲(chǔ)) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (溫度循環(huán)) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (壓力蒸煮試驗(yàn)) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （無(wú)偏高加速應(yīng)力試驗(yàn)） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高溫高濕反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (預(yù)處理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 85℃/85%RH ，168hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Shanghai address：Room 1106, Building B, 2305 Zuchongzhi Road, Pudong New Area, ShanghaiHefei address：F1-706, Phase II, Innovation Industrial Park, No.2800, Innovation Avenue, High-tech Zone, Hefei city, Anhui Province
Tel：18217298861 Mr. Gao
Email：[email protected]
